Title : Study of the L-series X-ray line widths of tungsten

Type of Material: Thesis
Title: Study of the L-series X-ray line widths of tungsten
Researcher: Srivastava, Raman Nath
Guide: Gokhale, B G
Department: Department of Electronics
Publisher: University of Lucknow
Place: Lucknow
Year: 1986
Language: English
Subject: Electronics
X and Gamma Rays
Spectroscopy
Dissertation/Thesis Note: PhD

00000000ntm a2200000ua 4500
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035__|a(IN-AhILN)th_137823
040__|aLUTL_226007|dIN-AhILN
041__|aeng
100__|aSrivastava, Raman Nath|eResearcher
110__|aDepartment of Electronics|bUniversity of Lucknow|dLucknow|eIn
245__|aStudy of the L-series X-ray line widths of tungsten
260__|aLucknow|bUniversity of Lucknow|c1986
502__|bPhD
653__|aElectronics
653__|aX and Gamma Rays
653__|aSpectroscopy
700__|aGokhale, B G|eGuide
905__|anotification

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