| Type of Material: | Thesis |
| Title: | Investigations on temperature distribution stresses and redistribution in silicon wafers during processing |
| Researcher: | Das, Jayanta kumar |
| Guide: | Mahapatra, S |
| Department: | Department of Electrical Engineering |
| Publisher: | Indian Institute of Technology-bombay |
| Place: | Mumbai |
| Year: | 1984 |
| Language: | English |
| Subject: | Engineering | Electronics Engineering | Microelectronics | Microelements | Electrical Engineering |
| Dissertation/Thesis Note: | PhD |
| 000 | 00000ntm a2200000ua 4500 | |
| 001 | 110843 | |
| 003 | IN-AhILN | |
| 005 | 2011-01-13 00:00:00 | |
| 008 | __ | 841231t1984||||ii#||||g|m||||||||||eng|| |
| 035 | __ | |a(IN-AhILN)th_110843 |
| 040 | __ | |aIITB_400076|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aDas, Jayanta kumar|eResearcher |
| 110 | __ | |aDepartment of Electrical Engineering|bIndian Institute of Technology-bombay|dMumbai|eIn |
| 245 | __ | |aInvestigations on temperature distribution stresses and redistribution in silicon wafers during processing |
| 260 | __ | |aMumbai|bIndian Institute of Technology-bombay|c1984 |
| 502 | __ | |bPhD |
| 650 | __ | |aElectrical Engineering|2UGC |
| 653 | __ | |aEngineering |
| 653 | __ | |aElectronics Engineering |
| 653 | __ | |aMicroelectronics |
| 653 | __ | |aMicroelements |
| 700 | __ | |aMahapatra, S|eGuide |
| 905 | __ | |anotification |
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