| Type of Material: | Thesis |
| Title: | Development of X-ray diffraction topographic technique and study of defects in AI2O3 crystals and ZnS whiskers |
| Researcher: | Vijay Kumar |
| Guide: | Verma, A R |
| Department: | Department of Physics |
| Publisher: | University of Delhi |
| Place: | New Delhi |
| Year: | 1984 |
| Language: | English |
| Subject: | Physics | Crystallography | Structural Crystallography | Diffraction Methods | Physics |
| Dissertation/Thesis Note: | PhD |
| 000 | 00000ntm a2200000ua 4500 | |
| 001 | 109734 | |
| 003 | IN-AhILN | |
| 005 | 2011-01-13 00:00:00 | |
| 008 | __ | 841231t1984||||ii#||||g|m||||||||||eng|| |
| 035 | __ | |a(IN-AhILN)th_109734 |
| 040 | __ | |aDELI_110007|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aVijay Kumar|eResearcher |
| 110 | __ | |aDepartment of Physics|bUniversity of Delhi|dNew Delhi|eIn |
| 245 | __ | |aDevelopment of X-ray diffraction topographic technique and study of defects in AI2O3 crystals and ZnS whiskers |
| 260 | __ | |aNew Delhi|bUniversity of Delhi|c1984 |
| 502 | __ | |bPhD |
| 650 | __ | |aPhysics|2UGC |
| 653 | __ | |aPhysics |
| 653 | __ | |aCrystallography |
| 653 | __ | |aStructural Crystallography |
| 653 | __ | |aDiffraction Methods |
| 700 | __ | |aVerma, A R|eGuide |
| 905 | __ | |anotification |
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