| Type of Material: | Thesis |
| Title: | Investigations on the properties of electrified interfaces: structure of the double layer at solid metals |
| Researcher: | Rama Krishnaiah, K |
| Department: | Department of Chemistry |
| Publisher: | Andhra University |
| Place: | Waltair |
| Year: | 1969 |
| Language: | English |
| Subject: | Double Layer | Solid metals |
| Accession No: | 196566 |
| Dissertation/Thesis Note: | PhD |
| 000 | 00000ntm a2200000ua 4500 | |
| 001 | 102817 | |
| 003 | IN-AhILN | |
| 005 | 2011-01-13 00:00:00 | |
| 008 | __ | 691231t1969||||ii#||||g|m||||||||||eng|| |
| 035 | __ | |a(IN-AhILN)th_102817 |
| 040 | __ | |aANDH_530003|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aRama Krishnaiah, K|eResearcher |
| 110 | __ | |aDepartment of Chemistry|bAndhra University|dWaltair|eIN |
| 245 | __ | |aInvestigations on the properties of electrified interfaces: structure of the double layer at solid metals |
| 260 | __ | |aWaltair|bAndhra University|c1969 |
| 502 | __ | |bPhD |
| 653 | __ | |aDouble Layer |
| 653 | __ | |aSolid metals |
| 852 | __ | |p196566 |
| 905 | __ | |anotification |
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