| Type of Material: | Thesis |
| Title: | DEVELOPMENT AND CHRACTERZATION OF ALSI, TI/ALSI LAYERED STRUCTURE AND TI SI2 THIN FILMS FOR VLSI INT |
| Researcher: | Devashrayee, Niranjan Maneklal |
| Guide: | George, P J |
| Department: | Department of Physics |
| Publisher: | Kurukshetra University |
| Place: | Kurukshetra |
| Year: | 1990 |
| Language: | English |
| Subject: | Physics | Physics |
| Accession No: | 238306 |
| Dissertation/Thesis Note: | PhD |
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