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|a621.37 |
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|aIEEE Instrumentation & Measurement Magazine |
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245
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|aIEEE Instrumentation & Measurement Magazine |
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260
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|aNew York|bInstitute of Electrical and Electronics Engineers |
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310
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|aQ |
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362
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|a1998 |
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500
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|aIP based Access provided to 100 universities. |
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506
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|aArchive access available under consortium from Vol.10 No.1 - Vol.9 No.6 |
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650
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|aMETROLOGY AND STANDARDIZATION |
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856
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4_ |
|uhttp://ieeexplore.ieee.org/Xplore/RecentIssue.jsp?Punumber=5289|zIP based access available from year 2001 to 2008 |
