| Key Title: | IEEE Transactions on Device and Materials Reliability | ISSN: | 1530-4388 | Language: | eng | Frequency: | Q | Publisher: | Piscataway, Institute of Electrical and Electronics Inc.(IEEE) | Notes: | IP based Access provided to 100 universities. Archive access available under consortium from Vol.2 No.1 - Vol.8 No.4 | Online Availability: | http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?puNumber=7298 (IP based access available from year 2002 to 2008) |
| 000 | 00000cas a2200000ua 4500 |
|---|---|
| 001 | 8923 |
| 003 | IN-AhILN |
| 005 | 20220322 000000.0 |
| 007 | t| |
| 008 | 750320c1uuu9999dcuwn p 0 a0eng |
| 016 | |aUMS8923|zINFL34893|2IN-AhILN |
| 041 | 0 |aeng |
| 222 | 0|aIEEE Transactions on Device and Materials Reliability |
| 245 | 10|aIEEE Transactions on Device and Materials Reliability |
| 260 | |aPiscataway|bInstitute of Electrical and Electronics Inc.(IEEE) |
| 044 | |dUS |
| 022 | 0 |a1530-4388 |
| 500 | |aIP based Access provided to 100 universities. |
| 310 | |aQ |
| 506 | |aArchive access available under consortium from Vol.2 No.1 - Vol.8 No.4 |
| 856 | 4 |uhttp://ieeexplore.ieee.org/xpl/RecentIssue.jsp?puNumber=7298|zIP based access available from year 2002 to 2008 |
| 850 | |aROOR-247667 |
| 950 | |aROOR-247667|bH|cNULL(missing: NULL) |