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1

Ultra-trace elemental analysis using total reflection x-ray fluorescence (TXRF) technique

Researcher:Tiwari, Manoj Kumar
Guide:Nadedkar, R V
Lodha, G S
University:Devi Ahilya Vishwavidyalaya
Language:English
2

Study of multilayer and single layer systems for x-ray polarizer and physical properties of fe/si multilayer

Researcher:Naik, Shyam
Guide:Lodha, G S
University:Devi Ahilya Vishwavidyalaya
Language:English
3

Interface characterization of multilayer mirrors

Researcher:Rai, Sanjay Kumar
Guide:Lodha, G S
University:Homi Bhabha National Institute
Language:English
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