IndCat

1	Studies on characteristics of III-V compound semiconductor based-hemt/modfet to use in analog VLSI circuits
Researcher:	Lenka, Trupti Ranjan
Guide:	Panda, A K Dash, G N
University:	Sambalpur University
Language:	English
2	Efficient methods and novel approaches for analog electronic circuit fault diagnosis using simulation before test SBT approach
Researcher:	Rao, S P Venu Madhava
Guide:	Babu, N Sarat Chandra Kishore, K Lal
University:	Jawaharlal Nehru Technological University Hyderabad
Language:	English
3	Extensive fault diagnosis of analog circuits adopting reconfigurable computing system
Researcher:	Poonguzhali, P
Guide:	Babu, N Sarat Chandra
University:	Jawaharlal Nehru Technological University Hyderabad
Language:	English